Ou, Q., Xue, S., Ma, W., Yang, J., Si, G., Liu, L., . . . Bao, Q. (2025). Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection.
Chicago Style (17th ed.) CitationOu, Qingdong, et al. Natural Van Der Waals Canalization Lens for Non-destructive Nanoelectronic Circuit Imaging and Inspection. 2025.
MLA (9th ed.) CitationOu, Qingdong, et al. Natural Van Der Waals Canalization Lens for Non-destructive Nanoelectronic Circuit Imaging and Inspection. 2025.
Warning: These citations may not always be 100% accurate.