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Main Authors: Roman-Vicharra, Cristhian, Sengupta, Prianka, Wang, Runzhi, Chen, Yiran, Hu, Jiang
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2502.10932
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author Roman-Vicharra, Cristhian
Sengupta, Prianka
Wang, Runzhi
Chen, Yiran
Hu, Jiang
author_facet Roman-Vicharra, Cristhian
Sengupta, Prianka
Wang, Runzhi
Chen, Yiran
Hu, Jiang
contents In heterogeneous integration, different dies may employ distinct technologies, making floorplanning across multiple dies inherently coupled with technology assignment. By assuming a fixed technology, almost all prior floorplanning studies were developed without addressing the challenge of technology assignment. This work presents the first systematic study of multi-die floorplanning that treats technology choice as a variable. To address the challenge of variable block areas, we incorporate a recent machine learning technique for rapid PPA estimation. Our methods jointly optimize area, wirelength, performance, power, and cost, thereby highlighting the importance of technology assignment. Experimental evaluations, validated with a commercial tool for both 2.5D and 3D ICs, demonstrate that our systematic optimizations significantly outperform a greedy approach.
format Preprint
id arxiv_https___arxiv_org_abs_2502_10932
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Simultaneous Multi-die Floorplanning and Technology Assignment
Roman-Vicharra, Cristhian
Sengupta, Prianka
Wang, Runzhi
Chen, Yiran
Hu, Jiang
Systems and Control
In heterogeneous integration, different dies may employ distinct technologies, making floorplanning across multiple dies inherently coupled with technology assignment. By assuming a fixed technology, almost all prior floorplanning studies were developed without addressing the challenge of technology assignment. This work presents the first systematic study of multi-die floorplanning that treats technology choice as a variable. To address the challenge of variable block areas, we incorporate a recent machine learning technique for rapid PPA estimation. Our methods jointly optimize area, wirelength, performance, power, and cost, thereby highlighting the importance of technology assignment. Experimental evaluations, validated with a commercial tool for both 2.5D and 3D ICs, demonstrate that our systematic optimizations significantly outperform a greedy approach.
title Simultaneous Multi-die Floorplanning and Technology Assignment
topic Systems and Control
url https://arxiv.org/abs/2502.10932