Improving electron tomography of mesoporous silica by Ga intrusion
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arXiv
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| Format: | Preprint |
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2025
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| author | Kichigin, Alexander Böhmer, Johannes Buwen, Moritz Zubiri, Benjamin Apeleo Wu, Mingjian Will, Johannes Drobek, Dominik Götz, Alexander Vorlaufer, Nora Söllner, Jakob Thommes, Matthias Felfer, Peter Przybilla, Thomas Spiecker, Erdmann |
| author_facet | Kichigin, Alexander Böhmer, Johannes Buwen, Moritz Zubiri, Benjamin Apeleo Wu, Mingjian Will, Johannes Drobek, Dominik Götz, Alexander Vorlaufer, Nora Söllner, Jakob Thommes, Matthias Felfer, Peter Przybilla, Thomas Spiecker, Erdmann |
| contents | Electron tomography (ET) offers nanoscale 3D characterization of mesoporous materials but is often limited by their low scattering contrast. Here, we introduce a gallium (Ga) intrusion strategy for mesoporous silica that dramatically improves imaging contrast - a key benefit that enables more accurate 3D reconstructions. By infiltrating Ga through a modified mercury intrusion porosimetry process, the high-angle annular dark-field (HAADF) STEM signal is enhanced by 5 times, resulting in a 34% improvement in reconstruction resolution and a 49% enhancement in interface sharpness. In addition, the increased sample conductivity facilitates focused ion beam (FIB) milling by minimizing charging effects and reducing drift. This approach enables precise segmentation and quantitative analysis of pore connectivity and size distribution, thereby extending the applicability of ET to light-element non-conductive materials and advancing structure-property characterization of complex porous systems. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2502_11794 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Improving electron tomography of mesoporous silica by Ga intrusion Kichigin, Alexander Böhmer, Johannes Buwen, Moritz Zubiri, Benjamin Apeleo Wu, Mingjian Will, Johannes Drobek, Dominik Götz, Alexander Vorlaufer, Nora Söllner, Jakob Thommes, Matthias Felfer, Peter Przybilla, Thomas Spiecker, Erdmann Optics Electron tomography (ET) offers nanoscale 3D characterization of mesoporous materials but is often limited by their low scattering contrast. Here, we introduce a gallium (Ga) intrusion strategy for mesoporous silica that dramatically improves imaging contrast - a key benefit that enables more accurate 3D reconstructions. By infiltrating Ga through a modified mercury intrusion porosimetry process, the high-angle annular dark-field (HAADF) STEM signal is enhanced by 5 times, resulting in a 34% improvement in reconstruction resolution and a 49% enhancement in interface sharpness. In addition, the increased sample conductivity facilitates focused ion beam (FIB) milling by minimizing charging effects and reducing drift. This approach enables precise segmentation and quantitative analysis of pore connectivity and size distribution, thereby extending the applicability of ET to light-element non-conductive materials and advancing structure-property characterization of complex porous systems. |
| title | Improving electron tomography of mesoporous silica by Ga intrusion |
| topic | Optics |
| url | https://arxiv.org/abs/2502.11794 |