Analysis of Josephson Junction Barrier Variation: A Combined Electron Microscopy, Breakdown and Monte-Carlo Approach
Fuente:
arXiv
Guardado en:
| Autores principales: | , , , |
|---|---|
| Formato: | Preprint |
| Publicado: |
2025
|
| Materias: | |
| Acceso en línea: | |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
| _version_ | 1866912638909284352 |
|---|---|
| author | Kennedy, Oscar W. Crawford, Kevin G. Shahbazi, Kowsar Shelly, Connor D. |
| author_facet | Kennedy, Oscar W. Crawford, Kevin G. Shahbazi, Kowsar Shelly, Connor D. |
| contents | Josephson junctions manufactured to tight tolerances are necessary components for superconducting quantum computing. Developing precise manufacturing techniques for Josephson junctions requires an understanding of their make-up and robust feedback metrics against which to optimise. Here we consider complementary techniques assessing what conclusions they allow us to draw about the barriers in junctions. Monte-Carlo simulations of barriers show that standard deviations of 15-20% of the total barrier thickness are compatible with our experimental data. Electrical breakdown allows us to probe the weakest points in barriers. Narrowing the distribution of this breakdown provides a promising feedback mechanism for barrier optimisation. Grouping junctions by breakdown voltage allows us to identify sub-ensembles of junctions with different median resistance. Transmission electron microscopy can be used to find average barrier thickness, although we highlight challenges forming robust conclusions on the distribution of thicknesses in a barrier from these experiments. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2502_13072 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Analysis of Josephson Junction Barrier Variation: A Combined Electron Microscopy, Breakdown and Monte-Carlo Approach Kennedy, Oscar W. Crawford, Kevin G. Shahbazi, Kowsar Shelly, Connor D. Quantum Physics Mesoscale and Nanoscale Physics Materials Science Applied Physics Josephson junctions manufactured to tight tolerances are necessary components for superconducting quantum computing. Developing precise manufacturing techniques for Josephson junctions requires an understanding of their make-up and robust feedback metrics against which to optimise. Here we consider complementary techniques assessing what conclusions they allow us to draw about the barriers in junctions. Monte-Carlo simulations of barriers show that standard deviations of 15-20% of the total barrier thickness are compatible with our experimental data. Electrical breakdown allows us to probe the weakest points in barriers. Narrowing the distribution of this breakdown provides a promising feedback mechanism for barrier optimisation. Grouping junctions by breakdown voltage allows us to identify sub-ensembles of junctions with different median resistance. Transmission electron microscopy can be used to find average barrier thickness, although we highlight challenges forming robust conclusions on the distribution of thicknesses in a barrier from these experiments. |
| title | Analysis of Josephson Junction Barrier Variation: A Combined Electron Microscopy, Breakdown and Monte-Carlo Approach |
| topic | Quantum Physics Mesoscale and Nanoscale Physics Materials Science Applied Physics |
| url | https://arxiv.org/abs/2502.13072 |