Where's the Bug? Attention Probing for Scalable Fault Localization
Fuente:
arXiv
Salvato in:
| Autori principali: | , , , , |
|---|---|
| Natura: | Preprint |
| Pubblicazione: |
2025
|
| Soggetti: | |
| Accesso online: | |
| Tags: |
Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!
|
| _version_ | 1866915162548600832 |
|---|---|
| author | Stein, Adam Wayne, Arthur Naik, Aaditya Naik, Mayur Wong, Eric |
| author_facet | Stein, Adam Wayne, Arthur Naik, Aaditya Naik, Mayur Wong, Eric |
| contents | Ensuring code correctness remains a challenging problem even as large language models (LLMs) become increasingly capable at code-related tasks. While LLM-based program repair systems can propose bug fixes using only a user's bug report, their effectiveness is fundamentally limited by their ability to perform fault localization (FL), a challenging problem for both humans and LLMs. Existing FL approaches rely on executable test cases, require training on costly and often noisy line-level annotations, or demand resource-intensive LLMs. In this paper, we present Bug Attention Probe (BAP), a method which learns state-of-the-art fault localization without any direct localization labels, outperforming traditional FL baselines and prompting of large-scale LLMs. We evaluate our approach across a variety of code settings, including real-world Java bugs from the standard Defects4J dataset as well as seven other datasets which span a diverse set of bug types and languages. Averaged across all eight datasets, BAP improves by 34.6% top-1 accuracy compared to the strongest baseline and 93.4% over zero-shot prompting GPT-4o. BAP is also significantly more efficient than prompting, outperforming large open-weight models at a small fraction of the computational cost. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2502_13966 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Where's the Bug? Attention Probing for Scalable Fault Localization Stein, Adam Wayne, Arthur Naik, Aaditya Naik, Mayur Wong, Eric Software Engineering Machine Learning Ensuring code correctness remains a challenging problem even as large language models (LLMs) become increasingly capable at code-related tasks. While LLM-based program repair systems can propose bug fixes using only a user's bug report, their effectiveness is fundamentally limited by their ability to perform fault localization (FL), a challenging problem for both humans and LLMs. Existing FL approaches rely on executable test cases, require training on costly and often noisy line-level annotations, or demand resource-intensive LLMs. In this paper, we present Bug Attention Probe (BAP), a method which learns state-of-the-art fault localization without any direct localization labels, outperforming traditional FL baselines and prompting of large-scale LLMs. We evaluate our approach across a variety of code settings, including real-world Java bugs from the standard Defects4J dataset as well as seven other datasets which span a diverse set of bug types and languages. Averaged across all eight datasets, BAP improves by 34.6% top-1 accuracy compared to the strongest baseline and 93.4% over zero-shot prompting GPT-4o. BAP is also significantly more efficient than prompting, outperforming large open-weight models at a small fraction of the computational cost. |
| title | Where's the Bug? Attention Probing for Scalable Fault Localization |
| topic | Software Engineering Machine Learning |
| url | https://arxiv.org/abs/2502.13966 |