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SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image

Fuente: arXiv

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Bibliographic Details
Main Authors:	Jin, Qian, Jiang, Yuqi, Lu, Xudong, Liu, Yumeng, Chen, Yining, Gao, Dawei, Sun, Qi, Zhuo, Cheng
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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