A Rapid Test for Accuracy and Bias of Face Recognition Technology

Fuente: arXiv

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Bibliographic Details
Main Authors:	Knott, Manuel, Serna, Ignacio, Mann, Ethan, Perona, Pietro
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.14996