AdverX-Ray: Ensuring X-Ray Integrity Through Frequency-Sensitive Adversarial VAEs

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Caetano, Francisco, Viviers, Christiaan, Filatova, Lena, de With, Peter H. N., van der Sommen, Fons
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2502.16610