Voltage Noise Thermometry in Integrated Circuits at Millikelvin Temperatures
Fuente:
arXiv
Guardado en:
| Autores principales: | Ridgard, G., Thompson, M., Schreckenberg, L., Deshpande, N., Cabrera-Galicia, A., Bourgeois, O., Doebele, V., Prance, J. |
|---|---|
| Formato: | Preprint |
| Publicado: |
2025
|
| Materias: | |
| Acceso en línea: | |
| Etiquetas: |
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