Carrier Emission and Capture Competition mediated A(n)BC Recombination Model in Semiconductors with Multi-Level Defects

Fuente: arXiv

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Bibliographic Details
Main Authors:	Wang, Shanshan, Huang, Menglin, Wei, Su-Huai, Gong, Xin-Gao, Chen, Shiyou
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.16846