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Carrier Emission and Capture Competition mediated A(n)BC Recombination Model in Semiconductors with Multi-Level Defects

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Wang, Shanshan, Huang, Menglin, Wei, Su-Huai, Gong, Xin-Gao, Chen, Shiyou
Natura:	Preprint
Pubblicazione:	2025
Soggetti:	Materials Science
Accesso online:	Acceder al recurso
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