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Defects in the $β$-Ga$_2$O$_3$($\bar201$)/HfO$_2$ MOS system and the effect of thermal treatments

Fuente: arXiv

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Bibliographic Details
Main Authors:	Agrawal, Khushabu. S., LaTorraca, Paolo, Valentijn, Jonas, Hawkins, Roberta, Gruszecki, Adam A., Roy, Joy, Lebedev, Vasily, Jones, Lewys, Wallace, Robert M., Young, Chadwin D., Hurley, Paul K., Cherkaoui, Karim
Format:	Preprint
Published:	2025
Subjects:	Materials Science Applied Physics
Online Access:	Acceder al recurso
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