A Survey on Foundation-Model-Based Industrial Defect Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yang, Tianle, Chang, Luyao, Yan, Jiadong, Li, Juntao, Wang, Zhi, Zhang, Ke
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.19106