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A Survey on Foundation-Model-Based Industrial Defect Detection

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Yang, Tianle, Chang, Luyao, Yan, Jiadong, Li, Juntao, Wang, Zhi, Zhang, Ke
Formato:	Preprint
Publicado:	2025
Materias:	Computer Vision and Pattern Recognition
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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