Can We Simplify Slide-level Fine-tuning of Pathology Foundation Models?

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Jiawen, Hu, Jiali, Sun, Qiehe, Yan, Renao, Ouyang, Minxi, Guan, Tian, Han, Anjia, He, Chao, He, Yonghong
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.20823