Calibration-free measurement of the phonon temperature around a single emitter

Fuente: arXiv
Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Granger, Francis, Bellet-Amalric, Edith, Kheng, Kuntheak, Nogues, Gilles, Ferrand, David, Cibert, Joel
Format: Preprint
Veröffentlicht: 2025
Schlagworte:
Online-Zugang:
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
_version_ 1866912251772928000
author Granger, Francis
Bellet-Amalric, Edith
Kheng, Kuntheak
Nogues, Gilles
Ferrand, David
Cibert, Joel
author_facet Granger, Francis
Bellet-Amalric, Edith
Kheng, Kuntheak
Nogues, Gilles
Ferrand, David
Cibert, Joel
contents The emission properties of a localized solid-state emitter are strongly influenced by its environment. The coupling to acoustic phonons impacts the coherence of the emitter and its temperature dependence, and also results in the apparition of phonon sidebands besides the sharp zero-phonon line. Here, we present a method for measuring the absolute temperature of a localized emitter by directly plotting the ratio of the Stokes and anti-Stokes components of the phonon sideband as a function of the shift from the zero-phonon line. This approach requires no calibration and knowledge of the system, making it applicable to a wide range of emitters and materials. We validate the method using a CdSe quantum dot in a ZnSe nanowire. We thus show that the quantum dot is significantly heated under non-resonant excitation when increasing the incident power at low temperature and is ascribed to the drop in thermal conductivity at these temperatures.
format Preprint
id arxiv_https___arxiv_org_abs_2502_20830
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Calibration-free measurement of the phonon temperature around a single emitter
Granger, Francis
Bellet-Amalric, Edith
Kheng, Kuntheak
Nogues, Gilles
Ferrand, David
Cibert, Joel
Optics
The emission properties of a localized solid-state emitter are strongly influenced by its environment. The coupling to acoustic phonons impacts the coherence of the emitter and its temperature dependence, and also results in the apparition of phonon sidebands besides the sharp zero-phonon line. Here, we present a method for measuring the absolute temperature of a localized emitter by directly plotting the ratio of the Stokes and anti-Stokes components of the phonon sideband as a function of the shift from the zero-phonon line. This approach requires no calibration and knowledge of the system, making it applicable to a wide range of emitters and materials. We validate the method using a CdSe quantum dot in a ZnSe nanowire. We thus show that the quantum dot is significantly heated under non-resonant excitation when increasing the incident power at low temperature and is ascribed to the drop in thermal conductivity at these temperatures.
title Calibration-free measurement of the phonon temperature around a single emitter
topic Optics
url https://arxiv.org/abs/2502.20830