Single-crystalline CrSb(0001) thin films grown by dc magnetron co-sputtering

Fuente: arXiv
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Main Authors: Bommanaboyena, S. P., Müller, C., Jarošová, M., Wolk, K., Telkamp, S., Zeng, P., Křížek, F., Uchimura, T., Badura, A., Olejník, K., Scheffler, D., Beranová, K., Banerjee, S., Ledinský, M., Reichlová, H., Jungwirth, T., Horák, L., Kriegner, D.
Format: Preprint
Published: 2025
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author Bommanaboyena, S. P.
Müller, C.
Jarošová, M.
Wolk, K.
Telkamp, S.
Zeng, P.
Křížek, F.
Uchimura, T.
Badura, A.
Olejník, K.
Scheffler, D.
Beranová, K.
Banerjee, S.
Ledinský, M.
Reichlová, H.
Jungwirth, T.
Horák, L.
Kriegner, D.
author_facet Bommanaboyena, S. P.
Müller, C.
Jarošová, M.
Wolk, K.
Telkamp, S.
Zeng, P.
Křížek, F.
Uchimura, T.
Badura, A.
Olejník, K.
Scheffler, D.
Beranová, K.
Banerjee, S.
Ledinský, M.
Reichlová, H.
Jungwirth, T.
Horák, L.
Kriegner, D.
contents The recent discovery of altermagnetism has sparked renewed interest in the growth of epitaxial films of the NiAs-phase polymorph of CrSb. This paper describes the magnetron sputtering-based fabrication and characterization of high-quality single crystalline CrSb(0001) thin films supported by an isostructural nonmagnetic PtSb buffer. X-ray diffraction and scanning transmission electron microscopy show that the films are phase pure and possess a very high crystalline quality (mosaicity ~0.05deg), while also being free of extended crystallographic defects. Both scanning electron microscopy and atomic force microscopy confirm their smooth and homogeneous topography. Additionally, the elemental composition of our films was found to be close to stoichiometric via electron probe microanalysis and x-ray fluorescence. Thus, the developed samples represent an ideal platform for further investigation of the material properties of CrSb.
format Preprint
id arxiv_https___arxiv_org_abs_2502_21113
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Single-crystalline CrSb(0001) thin films grown by dc magnetron co-sputtering
Bommanaboyena, S. P.
Müller, C.
Jarošová, M.
Wolk, K.
Telkamp, S.
Zeng, P.
Křížek, F.
Uchimura, T.
Badura, A.
Olejník, K.
Scheffler, D.
Beranová, K.
Banerjee, S.
Ledinský, M.
Reichlová, H.
Jungwirth, T.
Horák, L.
Kriegner, D.
Materials Science
Mesoscale and Nanoscale Physics
The recent discovery of altermagnetism has sparked renewed interest in the growth of epitaxial films of the NiAs-phase polymorph of CrSb. This paper describes the magnetron sputtering-based fabrication and characterization of high-quality single crystalline CrSb(0001) thin films supported by an isostructural nonmagnetic PtSb buffer. X-ray diffraction and scanning transmission electron microscopy show that the films are phase pure and possess a very high crystalline quality (mosaicity ~0.05deg), while also being free of extended crystallographic defects. Both scanning electron microscopy and atomic force microscopy confirm their smooth and homogeneous topography. Additionally, the elemental composition of our films was found to be close to stoichiometric via electron probe microanalysis and x-ray fluorescence. Thus, the developed samples represent an ideal platform for further investigation of the material properties of CrSb.
title Single-crystalline CrSb(0001) thin films grown by dc magnetron co-sputtering
topic Materials Science
Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2502.21113