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Determination of Mid-Infrared Refractive Indices of Superconducting Thin Films Using Fourier Transform Infrared Spectroscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Paul, Dip Joti, Zhou, Tony X., Berggren, Karl K.
Format:	Preprint
Published:	2025
Subjects:	Optics Superconductivity
Online Access:	Acceder al recurso
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