Scalable and Accurate Application-Level Crash-Consistency Testing via Representative Testing

Fuente: arXiv
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Bibliographic Details
Main Authors: Gu, Yile, Neal, Ian, Xu, Jiexiao, Lee, Shaun Christopher, Said, Ayman, Haydar, Musa, Van Geffen, Jacob, Kadekodi, Rohan, Quinn, Andrew, Kasikci, Baris
Format: Preprint
Published: 2025
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