Kałuzińska, O. A., Diehl, L., Sicking, E., Mühlnikel, M. C., de Almeida, P. G. D., Kieseler, J., . . . Defranchis, M. M. (2025). Annealing behaviour of charge collection of neutron irradiated diodes from 8-inch p-type silicon wafers.
Cita Chicago Style (17a ed.)Kałuzińska, Oliwia Agnieszka, Leena Diehl, Eva Sicking, Marie Christin Mühlnikel, Pedro Gonçalo Dias de Almeida, Jan Kieseler, Matthias Kettner, David Walter, y Matteo M. Defranchis. Annealing Behaviour of Charge Collection of Neutron Irradiated Diodes from 8-inch P-type Silicon Wafers. 2025.
Cita MLA (9a ed.)Kałuzińska, Oliwia Agnieszka, et al. Annealing Behaviour of Charge Collection of Neutron Irradiated Diodes from 8-inch P-type Silicon Wafers. 2025.
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