An accurate and robust level-set formulation for multiple junction kinetics
Fuente:
arXiv
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Preprint |
| Published: |
2025
|
| Subjects: | |
| Online Access: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1866910857226616832 |
|---|---|
| author | Li, Tianchi Bernacki, Marc |
| author_facet | Li, Tianchi Bernacki, Marc |
| contents | The front-capturing Level-Set (LS) method is widely employed in academia and industry to model grain boundary (GB) migration during the microstructure evolution of polycrystalline materials under thermo-mechanical treatments. During capillarity-driven grain growth, the conventional mean curvature flow equation, $\vec{v} = - μγκ\vec{n}$, is used to compute the GB normal migration velocity. Over recent decades, extensive efforts have been made to incorporate polycrystalline heterogeneity into this framework. However, despite increased complexity and computational costs, these approaches have yet to achieve fully satisfactory performance. This paper introduces a simple yet robust LS formulation that accurately captures multiple junction kinetics, even with extreme GB energy ratios. Validation against existing analytical solutions highlights the method's accuracy and efficiency. This novel approach offers significant potential for advancing the study of highly heterogeneous interface systems. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2503_02061 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | An accurate and robust level-set formulation for multiple junction kinetics Li, Tianchi Bernacki, Marc Computational Engineering, Finance, and Science Materials Science The front-capturing Level-Set (LS) method is widely employed in academia and industry to model grain boundary (GB) migration during the microstructure evolution of polycrystalline materials under thermo-mechanical treatments. During capillarity-driven grain growth, the conventional mean curvature flow equation, $\vec{v} = - μγκ\vec{n}$, is used to compute the GB normal migration velocity. Over recent decades, extensive efforts have been made to incorporate polycrystalline heterogeneity into this framework. However, despite increased complexity and computational costs, these approaches have yet to achieve fully satisfactory performance. This paper introduces a simple yet robust LS formulation that accurately captures multiple junction kinetics, even with extreme GB energy ratios. Validation against existing analytical solutions highlights the method's accuracy and efficiency. This novel approach offers significant potential for advancing the study of highly heterogeneous interface systems. |
| title | An accurate and robust level-set formulation for multiple junction kinetics |
| topic | Computational Engineering, Finance, and Science Materials Science |
| url | https://arxiv.org/abs/2503.02061 |