Exploring Intrinsic Normal Prototypes within a Single Image for Universal Anomaly Detection

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Hauptverfasser: Luo, Wei, Cao, Yunkang, Yao, Haiming, Zhang, Xiaotian, Lou, Jianan, Cheng, Yuqi, Shen, Weiming, Yu, Wenyong
Format: Preprint
Veröffentlicht: 2025
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author Luo, Wei
Cao, Yunkang
Yao, Haiming
Zhang, Xiaotian
Lou, Jianan
Cheng, Yuqi
Shen, Weiming
Yu, Wenyong
author_facet Luo, Wei
Cao, Yunkang
Yao, Haiming
Zhang, Xiaotian
Lou, Jianan
Cheng, Yuqi
Shen, Weiming
Yu, Wenyong
contents Anomaly detection (AD) is essential for industrial inspection, yet existing methods typically rely on ``comparing'' test images to normal references from a training set. However, variations in appearance and positioning often complicate the alignment of these references with the test image, limiting detection accuracy. We observe that most anomalies manifest as local variations, meaning that even within anomalous images, valuable normal information remains. We argue that this information is useful and may be more aligned with the anomalies since both the anomalies and the normal information originate from the same image. Therefore, rather than relying on external normality from the training set, we propose INP-Former, a novel method that extracts Intrinsic Normal Prototypes (INPs) directly from the test image. Specifically, we introduce the INP Extractor, which linearly combines normal tokens to represent INPs. We further propose an INP Coherence Loss to ensure INPs can faithfully represent normality for the testing image. These INPs then guide the INP-Guided Decoder to reconstruct only normal tokens, with reconstruction errors serving as anomaly scores. Additionally, we propose a Soft Mining Loss to prioritize hard-to-optimize samples during training. INP-Former achieves state-of-the-art performance in single-class, multi-class, and few-shot AD tasks across MVTec-AD, VisA, and Real-IAD, positioning it as a versatile and universal solution for AD. Remarkably, INP-Former also demonstrates some zero-shot AD capability. Code is available at:https://github.com/luow23/INP-Former.
format Preprint
id arxiv_https___arxiv_org_abs_2503_02424
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Exploring Intrinsic Normal Prototypes within a Single Image for Universal Anomaly Detection
Luo, Wei
Cao, Yunkang
Yao, Haiming
Zhang, Xiaotian
Lou, Jianan
Cheng, Yuqi
Shen, Weiming
Yu, Wenyong
Computer Vision and Pattern Recognition
Anomaly detection (AD) is essential for industrial inspection, yet existing methods typically rely on ``comparing'' test images to normal references from a training set. However, variations in appearance and positioning often complicate the alignment of these references with the test image, limiting detection accuracy. We observe that most anomalies manifest as local variations, meaning that even within anomalous images, valuable normal information remains. We argue that this information is useful and may be more aligned with the anomalies since both the anomalies and the normal information originate from the same image. Therefore, rather than relying on external normality from the training set, we propose INP-Former, a novel method that extracts Intrinsic Normal Prototypes (INPs) directly from the test image. Specifically, we introduce the INP Extractor, which linearly combines normal tokens to represent INPs. We further propose an INP Coherence Loss to ensure INPs can faithfully represent normality for the testing image. These INPs then guide the INP-Guided Decoder to reconstruct only normal tokens, with reconstruction errors serving as anomaly scores. Additionally, we propose a Soft Mining Loss to prioritize hard-to-optimize samples during training. INP-Former achieves state-of-the-art performance in single-class, multi-class, and few-shot AD tasks across MVTec-AD, VisA, and Real-IAD, positioning it as a versatile and universal solution for AD. Remarkably, INP-Former also demonstrates some zero-shot AD capability. Code is available at:https://github.com/luow23/INP-Former.
title Exploring Intrinsic Normal Prototypes within a Single Image for Universal Anomaly Detection
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2503.02424