Copertina

Quality Concerns Caused by Quality Control -- deformation of silicon strip detector modules in thermal cycling tests

Fuente: arXiv

Salvato in:

Dettagli Bibliografici
Autori principali:	Salami, Richard, Poley, Luise, Affolder, Kirsten, Affolder, Tony, Bayer, Lukas, Crick, Ben, Duden, Emily, Dyckes, Ian George, Fadeyev, Vitaliy, Fortman, Anne, Federic, Pavol, Franconi, Laura, Gignac, Matthew, Gupta, Shubham, Hallford, John, Helling, Cole, Hill, Ewan, Hu, Miao, Kroll, Jiri, Kumari, Priyanka, Lacasta, Carlos, Levagood, Madison, Lopez, Hanlez, Morelos-Zaragoza, Len, Moshe, Meny Raviv, Petersen, Aaron, Platero, Vicente, Rajagopalan, Archa Devi, Sitnikova, Lisa, Solaz, Carles, Soldevila, Urmila, Speers, Peter, Van Nieuwenhuizen, Gerrit, Wang, Alex Zeng
Natura:	Preprint
Pubblicazione:	2025
Soggetti:	High Energy Physics - Experiment Instrumentation and Detectors
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

Accesso online

https://arxiv.org/abs/2503.03133