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Quality Concerns Caused by Quality Control -- deformation of silicon strip detector modules in thermal cycling tests

Fuente: arXiv

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Bibliographic Details
Main Authors:	Salami, Richard, Poley, Luise, Affolder, Kirsten, Affolder, Tony, Bayer, Lukas, Crick, Ben, Duden, Emily, Dyckes, Ian George, Fadeyev, Vitaliy, Fortman, Anne, Federic, Pavol, Franconi, Laura, Gignac, Matthew, Gupta, Shubham, Hallford, John, Helling, Cole, Hill, Ewan, Hu, Miao, Kroll, Jiri, Kumari, Priyanka, Lacasta, Carlos, Levagood, Madison, Lopez, Hanlez, Morelos-Zaragoza, Len, Moshe, Meny Raviv, Petersen, Aaron, Platero, Vicente, Rajagopalan, Archa Devi, Sitnikova, Lisa, Solaz, Carles, Soldevila, Urmila, Speers, Peter, Van Nieuwenhuizen, Gerrit, Wang, Alex Zeng
Format:	Preprint
Published:	2025
Subjects:	High Energy Physics - Experiment Instrumentation and Detectors
Online Access:	Acceder al recurso
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