Rutherford Backscattering Spectrometry analysis of the formation of superconducting V$_3$Si thin films

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Gessesew, Fshatsion B., Bose, Manjith, Ganesan, Kumaravelu, Johnson, Brett C., McCallum, Jeffrey C.
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!