TRACE: Your Diffusion Model is Secretly an Instance Edge Detector

Fuente: arXiv

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Bibliographic Details
Main Authors:	Jo, Sanghyun, Lee, Ziseok, Lee, Wooyeol, Choi, Jonghyun, Park, Jaesik, Kim, Kyungsu
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2503.07982