Mechanisms of proton irradiation-induced defects on the electrical performance of 4H-SiC PIN detectors

Fuente: arXiv
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Bibliographic Details
Main Authors: Li, Zaiyi., Zhang, Xiyuan., Wang, Congcong., Qu, Haolan., Chen, Jiaxiang., Liu, Peilian., Xiao, Suyu., Zou, Xinbo., Lu, Hai., Shi, Xin.
Format: Preprint
Published: 2025
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