Dislocation correlations in GaN epitaxial films revealed by EBSD and XRD

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kaganer, Vladimir M., Spallek, Domenik, John, Philipp, Brandt, Oliver, Lähnemann, Jonas
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2503.09171