DarkBench: Benchmarking Dark Patterns in Large Language Models

Fuente: arXiv
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Bibliographic Details
Main Authors: Kran, Esben, Nguyen, Hieu Minh "Jord", Kundu, Akash, Jawhar, Sami, Park, Jinsuk, Jurewicz, Mateusz Maria
Format: Preprint
Published: 2025
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