Multi-View Industrial Anomaly Detection with Epipolar Constrained Cross-View Fusion

Fuente: arXiv

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Bibliographic Details
Main Authors:	Liu, Yifan, Xu, Xun, Li, Shijie, Liao, Jingyi, Yang, Xulei
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2503.11088