The Role of Hydrogen and Oxygen Interstitial Defects in Crystalline Si cells: Mechanism of Device Degradation in Humid Environment

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Bo, Zhang, Feifei, Pang, Yu, Hu, Jinyu, Zhao, Huiyan, Liu, Guocai, He, Chao, An, Xingtao
Format:	Preprint
Published:	2025
Subjects:	Materials Science 82D37
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2503.11100