The Role of Hydrogen and Oxygen Interstitial Defects in Crystalline Si cells: Mechanism of Device Degradation in Humid Environment

Fuente: arXiv
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Main Authors: Li, Bo, Zhang, Feifei, Pang, Yu, Hu, Jinyu, Zhao, Huiyan, Liu, Guocai, He, Chao, An, Xingtao
Format: Preprint
Published: 2025
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