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| Main Authors: | , , , , |
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| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2503.12417 |
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| _version_ | 1866910877667557376 |
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| author | Barnea, Orr Einav, Dror Drotleff, Jonas Hochner, Idan Meir, Ziv |
| author_facet | Barnea, Orr Einav, Dror Drotleff, Jonas Hochner, Idan Meir, Ziv |
| contents | Stray electric fields induce excess micromotion in ion traps, limiting experimental performance. We present a new micromotion-compensation technique that utilizes a dark ion in a bright-dark-bright linear ion crystal. Stray electric fields in the radial plane of the trap deform the crystal axially. We exploit the mode softening near the transition to the zig-zag configuration to increase our sensitivity dramatically. We corroborate our results with a modified ion-displacement compensation method using a single bright ion. Our modification allows us to compensate stray fields on the 2D radial plane from a 1D measurement of the ion position on the camera. Both methods require only a fixed imaging camera and continuous ion-fluorescence detection. As such, they can be readily implemented in virtually any ion-trapping experiment without additional hardware modifications. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2503_12417 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Micromotion compensation using dark and bright ions Barnea, Orr Einav, Dror Drotleff, Jonas Hochner, Idan Meir, Ziv Atomic Physics Stray electric fields induce excess micromotion in ion traps, limiting experimental performance. We present a new micromotion-compensation technique that utilizes a dark ion in a bright-dark-bright linear ion crystal. Stray electric fields in the radial plane of the trap deform the crystal axially. We exploit the mode softening near the transition to the zig-zag configuration to increase our sensitivity dramatically. We corroborate our results with a modified ion-displacement compensation method using a single bright ion. Our modification allows us to compensate stray fields on the 2D radial plane from a 1D measurement of the ion position on the camera. Both methods require only a fixed imaging camera and continuous ion-fluorescence detection. As such, they can be readily implemented in virtually any ion-trapping experiment without additional hardware modifications. |
| title | Micromotion compensation using dark and bright ions |
| topic | Atomic Physics |
| url | https://arxiv.org/abs/2503.12417 |