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| Main Authors: | , , , , , , |
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| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2503.12459 |
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| _version_ | 1866913738643210240 |
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| author | Fujisawa, Kazunori Carvalho, Bruno R. Venezuela, Pedro Kang, Cheon-Soo Kim, Yoong Ahm Hayashi, Takuya Terrones, Mauricio |
| author_facet | Fujisawa, Kazunori Carvalho, Bruno R. Venezuela, Pedro Kang, Cheon-Soo Kim, Yoong Ahm Hayashi, Takuya Terrones, Mauricio |
| contents | Point defects, though atomically small, significantly influence the properties of 2D materials. A general method for characterizing point defect density ($n_{ D }$) in graphenic materials with arbitrary layer number ($n_{ L }$) is currently lacking. Here, we introduce the Graphene Atlas, a non-destructive Raman spectroscopy-based framework for defect quantification in diverse graphenic systems. We demonstrate that the relative fractions of the double-resonance D and 2D Raman bands, which arise from competing scattering processes, exhibit a universal relationship with $n_{ D }$, independent of $n_{ L }$. Plotting Raman data on a plane defined by defect-related and layer number-related parameters enables a direct and quantitative determination of $n_{ D }$ and $n_{ L }$. This Graphene Atlas provides a transformative tool for real-time defect quantification in scalable manufacturing of graphenic materials, bridging fundamental research and industrial applications. This framework establishes a new standard for defect characterization of graphenic systems, facilitating their optimization for advanced technological applications. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2503_12459 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | A Universal Raman Spectroscopic Framework for Defect Quantification in Mono-to-Multilayer Graphenic Materials: The Graphene Atlas Fujisawa, Kazunori Carvalho, Bruno R. Venezuela, Pedro Kang, Cheon-Soo Kim, Yoong Ahm Hayashi, Takuya Terrones, Mauricio Materials Science Point defects, though atomically small, significantly influence the properties of 2D materials. A general method for characterizing point defect density ($n_{ D }$) in graphenic materials with arbitrary layer number ($n_{ L }$) is currently lacking. Here, we introduce the Graphene Atlas, a non-destructive Raman spectroscopy-based framework for defect quantification in diverse graphenic systems. We demonstrate that the relative fractions of the double-resonance D and 2D Raman bands, which arise from competing scattering processes, exhibit a universal relationship with $n_{ D }$, independent of $n_{ L }$. Plotting Raman data on a plane defined by defect-related and layer number-related parameters enables a direct and quantitative determination of $n_{ D }$ and $n_{ L }$. This Graphene Atlas provides a transformative tool for real-time defect quantification in scalable manufacturing of graphenic materials, bridging fundamental research and industrial applications. This framework establishes a new standard for defect characterization of graphenic systems, facilitating their optimization for advanced technological applications. |
| title | A Universal Raman Spectroscopic Framework for Defect Quantification in Mono-to-Multilayer Graphenic Materials: The Graphene Atlas |
| topic | Materials Science |
| url | https://arxiv.org/abs/2503.12459 |