APA (7th ed.) Citation

Deng, W., Shi, B., Li, M., & Simeone, O. (2025). SCAN-BEST: Sub-6GHz-Aided Near-field Beam Selection with Formal Reliability Guarantees.

Chicago Style (17th ed.) Citation

Deng, Weicao, Binpu Shi, Min Li, and Osvaldo Simeone. SCAN-BEST: Sub-6GHz-Aided Near-field Beam Selection with Formal Reliability Guarantees. 2025.

MLA (9th ed.) Citation

Deng, Weicao, et al. SCAN-BEST: Sub-6GHz-Aided Near-field Beam Selection with Formal Reliability Guarantees. 2025.