EIAD: Explainable Industrial Anomaly Detection Via Multi-Modal Large Language Models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhang, Zongyun, Ruan, Jiacheng, Gao, Xian, Liu, Ting, Fu, Yuzhuo
Format:	Preprint
Published:	2025
Subjects:	Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2503.14162