Towards Identifying the PL6 Center in SiC: From First-Principles Screening to Hyperfine Validation of Competing Defect Candidates

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhao, Xin, Liu, Mingzhe, Chen, Yu, Zhang, Qi, Duan, Chang-Kui
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2503.14170