Saved in:
Bibliographic Details
Main Authors: Ursini, Edson Luiz, Poletti, Elaine Cristina Catapani, da Silveira, Loreno Menezes, Leite, José Roberto Emiliano
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2503.14514
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866908274225315840
author Ursini, Edson Luiz
Poletti, Elaine Cristina Catapani
da Silveira, Loreno Menezes
Leite, José Roberto Emiliano
author_facet Ursini, Edson Luiz
Poletti, Elaine Cristina Catapani
da Silveira, Loreno Menezes
Leite, José Roberto Emiliano
contents The double hypothesis test (DHT) is a test that allows controlling Type I (producer) and Type II (consumer) errors. It is possible to say whether the batch has a defect rate, p, between 1.5 and 2%, or between 2 and 5%, or between 5 and 10%, and so on, until finding a required value for this probability. Using the two probabilities side by side, the Type I error for the lower probability distribution and the Type II error for the higher probability distribution, both can be controlled and minimized. It can be applied in the development or manufacturing process of a batch of components, or in the case of purchasing from a supplier, when the percentage of defects (p) is unknown, considering the technology and/or process available to obtain them. The power of the test is amplified by the joint application of the Limit of Successive Failures (LSF) related to the Renewal Theory. To enable the choice of the most appropriate algorithm for each application. Four distributions are proposed for the Bernoulli event sequence, including their computational efforts: Binomial, Binomial approximated by Poisson, and Binomial approximated by Gaussian (with two variants). Fuzzy logic rules are also applied to facilitate decision-making.
format Preprint
id arxiv_https___arxiv_org_abs_2503_14514
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Acceptance or Rejection of Lots while Minimizing and Controlling Type I and Type II Errors
Ursini, Edson Luiz
Poletti, Elaine Cristina Catapani
da Silveira, Loreno Menezes
Leite, José Roberto Emiliano
Methodology
Artificial Intelligence
Numerical Analysis
The double hypothesis test (DHT) is a test that allows controlling Type I (producer) and Type II (consumer) errors. It is possible to say whether the batch has a defect rate, p, between 1.5 and 2%, or between 2 and 5%, or between 5 and 10%, and so on, until finding a required value for this probability. Using the two probabilities side by side, the Type I error for the lower probability distribution and the Type II error for the higher probability distribution, both can be controlled and minimized. It can be applied in the development or manufacturing process of a batch of components, or in the case of purchasing from a supplier, when the percentage of defects (p) is unknown, considering the technology and/or process available to obtain them. The power of the test is amplified by the joint application of the Limit of Successive Failures (LSF) related to the Renewal Theory. To enable the choice of the most appropriate algorithm for each application. Four distributions are proposed for the Bernoulli event sequence, including their computational efforts: Binomial, Binomial approximated by Poisson, and Binomial approximated by Gaussian (with two variants). Fuzzy logic rules are also applied to facilitate decision-making.
title Acceptance or Rejection of Lots while Minimizing and Controlling Type I and Type II Errors
topic Methodology
Artificial Intelligence
Numerical Analysis
url https://arxiv.org/abs/2503.14514