Degradation of 2.4-kV $Ga_{2}O_{3}$ Schottky Barrier Diode at High Temperatures up to 500 °C

Fuente: arXiv
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Bibliographic Details
Main Authors: Ellis, Hunter, Jia, Wei, Rahaman, Imteaz, Hillas, Apostoli, Li, Botong, Scarpulla, Michael A., Rodriguez, Berardi Sensale, Fu, Kai
Format: Preprint
Published: 2025
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