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Degradation of 2.4-kV $Ga_{2}O_{3}$ Schottky Barrier Diode at High Temperatures up to 500 °C

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Ellis, Hunter, Jia, Wei, Rahaman, Imteaz, Hillas, Apostoli, Li, Botong, Scarpulla, Michael A., Rodriguez, Berardi Sensale, Fu, Kai
Formato:	Preprint
Publicado:	2025
Materias:	Materials Science
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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