BPINN-EM-Post: Bayesian Physics-Informed Neural Network based Stochastic Electromigration Damage Analysis in the Post-void Phase

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Lamichhane, Subed, Lu, Haotian, Tan, Sheldon X. -D.
Format:	Preprint
Published:	2025
Subjects:	Machine Learning
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2503.17393