Saved in:
Bibliographic Details
Main Authors: Pardo-Almanza, Markel, Fujisawa, Yuita, Onishi, Takatsugu, Hsu, Chia Hsiu, LaGrow, Alec P., Okada, Yoshinori
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2503.17568
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866908277669888000
author Pardo-Almanza, Markel
Fujisawa, Yuita
Onishi, Takatsugu
Hsu, Chia Hsiu
LaGrow, Alec P.
Okada, Yoshinori
author_facet Pardo-Almanza, Markel
Fujisawa, Yuita
Onishi, Takatsugu
Hsu, Chia Hsiu
LaGrow, Alec P.
Okada, Yoshinori
contents The heterointerface between topological insulators and magnetic materials provides a crucial platform for investigating exotic electronic and magnetic phases, with implications for both fundamental studies and potential applications. A key challenge is determining the spatial extent of magnetic perturbation across the interface. In this study, we grew Bi2Te3 films with mixed thicknesses of 5 and 6 quintuple layers (QLs) on a thick ferromagnetic Cr2Te3 film. Chemical analysis indicates gradual Cr diffusion across the interface into Bi2Te3, reaching up to the 4th QL, while the 5th and 6th QL remain free of Cr. Despite the absence of direct Cr incorporation, quasiparticle interference imaging using spectroscopic scanning tunneling microscopy reveals strong backscattering on the 5th QL surface. This suggests an intrinsic magnetic proximity effect, which breaks time-reversal symmetry without magnetic doping, extending into the 5th QLs. Although variations may exist across different systems, the large magnetic perturbation length scale observed here is a valuable guiding principle for engineering exotic electronic and magnetic states at heterointerfaces between topological insulators and magnetic materials.
format Preprint
id arxiv_https___arxiv_org_abs_2503_17568
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Long-range magnetic perturbations at Bi2Te3/Cr2Te3 interfaces induced by chemical diffusion and proximity effects
Pardo-Almanza, Markel
Fujisawa, Yuita
Onishi, Takatsugu
Hsu, Chia Hsiu
LaGrow, Alec P.
Okada, Yoshinori
Materials Science
Strongly Correlated Electrons
The heterointerface between topological insulators and magnetic materials provides a crucial platform for investigating exotic electronic and magnetic phases, with implications for both fundamental studies and potential applications. A key challenge is determining the spatial extent of magnetic perturbation across the interface. In this study, we grew Bi2Te3 films with mixed thicknesses of 5 and 6 quintuple layers (QLs) on a thick ferromagnetic Cr2Te3 film. Chemical analysis indicates gradual Cr diffusion across the interface into Bi2Te3, reaching up to the 4th QL, while the 5th and 6th QL remain free of Cr. Despite the absence of direct Cr incorporation, quasiparticle interference imaging using spectroscopic scanning tunneling microscopy reveals strong backscattering on the 5th QL surface. This suggests an intrinsic magnetic proximity effect, which breaks time-reversal symmetry without magnetic doping, extending into the 5th QLs. Although variations may exist across different systems, the large magnetic perturbation length scale observed here is a valuable guiding principle for engineering exotic electronic and magnetic states at heterointerfaces between topological insulators and magnetic materials.
title Long-range magnetic perturbations at Bi2Te3/Cr2Te3 interfaces induced by chemical diffusion and proximity effects
topic Materials Science
Strongly Correlated Electrons
url https://arxiv.org/abs/2503.17568