Lateral force microscopy calibration using an interferometric atomic force microscope

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Lefever, Joel, Labuda, Aleksander, Proksch, Roger
Format:	Preprint
Published:	2025
Subjects:	Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2503.18766