Removal of high-voltage-induced surface charges by ultraviolet light
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arXiv
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| Auteurs principaux: | , , , , |
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| Format: | Preprint |
| Publié: |
2025
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| _version_ | 1866917967953920000 |
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| author | Ziemba, M. T. Phrompao, J. Jung, F. Rabey, I. M. Rempe, G. |
| author_facet | Ziemba, M. T. Phrompao, J. Jung, F. Rabey, I. M. Rempe, G. |
| contents | A plethora of studies ranging from precision physics to quantum information employ ions, highly excited neutral atoms or polar molecules as tools. Motivated by the need for miniaturization, scalability and controllability, the particles are often trapped close to electrodes imprinted on dielectric surfaces. However, such geometry makes the particles susceptible to undesired surface charges. To understand how high voltage applied to the electrodes mediates the buildup of charges, we use a scanning Kelvin probe in an ultrahigh vacuum to investigate the electric potential landscape of an electrostatic molecule trap with a microstructured electrode array. We find that the surface becomes positively charged after applying voltages to the electrodes, leading to offset and patch electric potentials across the surface. Removal of these charges is demonstrated using ultraviolet light. The dynamics of this process, including the dependence on light intensity, wavelength and sample type, are investigated in detail. We find the charge removal to be faster for shorter ultraviolet wavelengths, with an additional polymer coating providing further enhancement. Our findings may be useful in a wide spectrum of experiments with electric-field-sensitive particles. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2503_19662 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Removal of high-voltage-induced surface charges by ultraviolet light Ziemba, M. T. Phrompao, J. Jung, F. Rabey, I. M. Rempe, G. Instrumentation and Detectors A plethora of studies ranging from precision physics to quantum information employ ions, highly excited neutral atoms or polar molecules as tools. Motivated by the need for miniaturization, scalability and controllability, the particles are often trapped close to electrodes imprinted on dielectric surfaces. However, such geometry makes the particles susceptible to undesired surface charges. To understand how high voltage applied to the electrodes mediates the buildup of charges, we use a scanning Kelvin probe in an ultrahigh vacuum to investigate the electric potential landscape of an electrostatic molecule trap with a microstructured electrode array. We find that the surface becomes positively charged after applying voltages to the electrodes, leading to offset and patch electric potentials across the surface. Removal of these charges is demonstrated using ultraviolet light. The dynamics of this process, including the dependence on light intensity, wavelength and sample type, are investigated in detail. We find the charge removal to be faster for shorter ultraviolet wavelengths, with an additional polymer coating providing further enhancement. Our findings may be useful in a wide spectrum of experiments with electric-field-sensitive particles. |
| title | Removal of high-voltage-induced surface charges by ultraviolet light |
| topic | Instrumentation and Detectors |
| url | https://arxiv.org/abs/2503.19662 |