Electric Field Distortions in Surface Ion Traps with Integrated Nanophotonics

Fuente: arXiv
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Main Authors: Du, Guochun, Jordan, Elena, Mehlstäubler, Tanja E.
Format: Preprint
Published: 2025
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_version_ 1866917971189825536
author Du, Guochun
Jordan, Elena
Mehlstäubler, Tanja E.
author_facet Du, Guochun
Jordan, Elena
Mehlstäubler, Tanja E.
contents The integration of photonic components into surface ion traps provides a scalable approach for trapped-ion quantum computing, sensing, and metrology, enabling compact systems with enhanced stability and precision. However, the introduction of optical apertures in the trap electrodes can distort the trapping electric field. This can lead to excess micromotion (EMM) and ion displacement which degrade the performance of quantum logic operations and optical clocks. In this work, we systematically investigate the electric field distortion in a surface ion trap with integrated waveguides and grating couplers using Finite Element Method (FEM) simulations. We analyze methods to reduce these distortions by exploiting symmetries and transparent conductive oxide materials.
format Preprint
id arxiv_https___arxiv_org_abs_2503_20387
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Electric Field Distortions in Surface Ion Traps with Integrated Nanophotonics
Du, Guochun
Jordan, Elena
Mehlstäubler, Tanja E.
Quantum Physics
The integration of photonic components into surface ion traps provides a scalable approach for trapped-ion quantum computing, sensing, and metrology, enabling compact systems with enhanced stability and precision. However, the introduction of optical apertures in the trap electrodes can distort the trapping electric field. This can lead to excess micromotion (EMM) and ion displacement which degrade the performance of quantum logic operations and optical clocks. In this work, we systematically investigate the electric field distortion in a surface ion trap with integrated waveguides and grating couplers using Finite Element Method (FEM) simulations. We analyze methods to reduce these distortions by exploiting symmetries and transparent conductive oxide materials.
title Electric Field Distortions in Surface Ion Traps with Integrated Nanophotonics
topic Quantum Physics
url https://arxiv.org/abs/2503.20387