THz carrier dynamics in $SrTiO_{3}/LaTiO_{3}$ interface two-dimensional electron gases

Fuente: arXiv
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Autori principali: Bhattacharya, Ahana, Darmawan, Andri, Han, Jeong Woo, Steinkamp, Frederik, Bingham, Nicholas S., Suess, Ryan J., Winnerl, Stephan, Grune, Markus E., Jin, Eric N., Walker, Frederick J., Ahn, Charles H., Pentcheva, Rossitza, Mittendorff, Martin
Natura: Preprint
Pubblicazione: 2025
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author Bhattacharya, Ahana
Darmawan, Andri
Han, Jeong Woo
Steinkamp, Frederik
Bingham, Nicholas S.
Suess, Ryan J.
Winnerl, Stephan
Grune, Markus E.
Jin, Eric N.
Walker, Frederick J.
Ahn, Charles H.
Pentcheva, Rossitza
Mittendorff, Martin
author_facet Bhattacharya, Ahana
Darmawan, Andri
Han, Jeong Woo
Steinkamp, Frederik
Bingham, Nicholas S.
Suess, Ryan J.
Winnerl, Stephan
Grune, Markus E.
Jin, Eric N.
Walker, Frederick J.
Ahn, Charles H.
Pentcheva, Rossitza
Mittendorff, Martin
contents A two-dimensional electron gas (2DEG) forms at the interface of complex oxides like $SrTiO_{3}$ (STO) and $LaTiO_{3}$ (LTO), despite each material having a low native conductivity, as a band and a Mott insulator, respectively. The interface 2DEG hosts charge carriers with moderate charge carrier density and mobility that raised interest as a material system for applications like field-effect transistors or detectors. Of particular interest is the integration of these oxide systems in silicon technology. To this end we study the carrier dynamics in a STO/LTO/STO heterostructure epitaxially grown on Si(001) both experimentally and theoretically. Linear THz spectroscopy was performed to analyze the temperature dependent charge carrier density and mobility, which was found to be in the range of $10^{12}$ $cm^2$ and 1000 $cm^2V^{-1}s^{-1}$, respectively. Pump-probe measurements revealed a very minor optical nonlinearity caused by hot carriers with a relaxation time of several 10 ps, even at low temperature. Density functional theory calculations with a Hubbard U term on ultrathin STO-capped LTO films on STO(001) show an effective mass of 0.64-0.68 $m_{e}$.
format Preprint
id arxiv_https___arxiv_org_abs_2503_21341
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle THz carrier dynamics in $SrTiO_{3}/LaTiO_{3}$ interface two-dimensional electron gases
Bhattacharya, Ahana
Darmawan, Andri
Han, Jeong Woo
Steinkamp, Frederik
Bingham, Nicholas S.
Suess, Ryan J.
Winnerl, Stephan
Grune, Markus E.
Jin, Eric N.
Walker, Frederick J.
Ahn, Charles H.
Pentcheva, Rossitza
Mittendorff, Martin
Materials Science
Mesoscale and Nanoscale Physics
Strongly Correlated Electrons
A two-dimensional electron gas (2DEG) forms at the interface of complex oxides like $SrTiO_{3}$ (STO) and $LaTiO_{3}$ (LTO), despite each material having a low native conductivity, as a band and a Mott insulator, respectively. The interface 2DEG hosts charge carriers with moderate charge carrier density and mobility that raised interest as a material system for applications like field-effect transistors or detectors. Of particular interest is the integration of these oxide systems in silicon technology. To this end we study the carrier dynamics in a STO/LTO/STO heterostructure epitaxially grown on Si(001) both experimentally and theoretically. Linear THz spectroscopy was performed to analyze the temperature dependent charge carrier density and mobility, which was found to be in the range of $10^{12}$ $cm^2$ and 1000 $cm^2V^{-1}s^{-1}$, respectively. Pump-probe measurements revealed a very minor optical nonlinearity caused by hot carriers with a relaxation time of several 10 ps, even at low temperature. Density functional theory calculations with a Hubbard U term on ultrathin STO-capped LTO films on STO(001) show an effective mass of 0.64-0.68 $m_{e}$.
title THz carrier dynamics in $SrTiO_{3}/LaTiO_{3}$ interface two-dimensional electron gases
topic Materials Science
Mesoscale and Nanoscale Physics
Strongly Correlated Electrons
url https://arxiv.org/abs/2503.21341