Host dependence of PL5 ensemble in 4H-SiC

Documenti analoghi

• Surface Structuring of Patterned 4H-SiC Surfaces Using a SiC/Si/SiC Sandwich Approach
  di: Jousseaume, Yann, et al.
  Pubblicazione: (2024)
• Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes
  di: Schwarberg, Jannik H., et al.
  Pubblicazione: (2026)
• Deterministic and Scalable Coupling of Single 4H-SiC Spin Defects into Bullseye Cavities
  di: Bao, Tongyuan, et al.
  Pubblicazione: (2025)
• Deterministic and Scalable Coupling of Single 4H‐SiC Spin Defects into Bullseye Cavities
  di: Tongyuan Bao, et al.
  Pubblicazione: (2025)
• Enhanced readout contrast of V2 ensembles in 4H-SiC through resonant optical excitation
  di: Tathfif, Infiter, et al.
  Pubblicazione: (2025)