Kwon, B., & Kim, M. (2025). One Look is Enough: Seamless Patchwise Refinement for Zero-Shot Monocular Depth Estimation on High-Resolution Images.
Chicago Style (17th ed.) CitationKwon, Byeongjun, and Munchurl Kim. One Look Is Enough: Seamless Patchwise Refinement for Zero-Shot Monocular Depth Estimation on High-Resolution Images. 2025.
MLA (9th ed.) CitationKwon, Byeongjun, and Munchurl Kim. One Look Is Enough: Seamless Patchwise Refinement for Zero-Shot Monocular Depth Estimation on High-Resolution Images. 2025.
Warning: These citations may not always be 100% accurate.