Zhang, T., Krayev, A., Yang, T. H., Mao, N., Hoang, L., Wang, Z., . . . Kong, J. (2025). Synthesis-related nanoscale defects in Mo-based Janus monolayers revealed by cross-correlated AFM and TERS imaging.
Style de citation Chicago (17e éd.)Zhang, Tianyi, et al. Synthesis-related Nanoscale Defects in Mo-based Janus Monolayers Revealed by Cross-correlated AFM and TERS Imaging. 2025.
Style de citation MLA (9e éd.)Zhang, Tianyi, et al. Synthesis-related Nanoscale Defects in Mo-based Janus Monolayers Revealed by Cross-correlated AFM and TERS Imaging. 2025.
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