Beyond Academic Benchmarks: Critical Analysis and Best Practices for Visual Industrial Anomaly Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Baitieva, Aimira, Bouaouni, Yacine, Briot, Alexandre, Ameln, Dick, Khalfaoui, Souhaiel, Akcay, Samet
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2503.23451